NEX CG II

NEX CG

NEX CG - Energy Dispersive X-ray Fluorescence Spectrometer Advanced Cartesian geometry

EDXRF for rapid qualitative and quantitative elemental analysis

Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards:

- Analyze ₁₁Na to ₉₂U non-destructively

- Solids, liquids, powders and thin films

- Polarized excitation for lower detection limits

- Novel treatment of peak overlap reduces errors

- ppb detection limits for aqueous samples using UltraCarry

- Simplified user interface with EZ Analysis

Polarized cartesian geometry for trace level sensitivity

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

Novel software reduces the need for standards

NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.

XRF options:

autosampler, vacuum, helium and standardless FP Options included fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity.

Typical uses of XRF include the analysis of petroleum oils and fuel, plastic, rubber and textiles, pharmaceutical products, foodstuffs, cosmetics and body care products, fertilizers, geological materials, mining feeds, slags and tails, cement, heat-resistant materials, glass, ceramics, catalysts, wafers; the determination of coatings on paper, film, polyester; metals and alloys, glass and plastic; forensics; multi-layer thin films on silicon wafers, photovoltaics and rotating storage media as well as pollution monitoring of solid waste, effluent, cleaning fluids, pools and filters. In addition, X-ray Transmission (XRT) process gauges are employed to measure sulfur (S) in crude oil and marine bunker fuel.

XRF spectrometers are the elemental analysis tool of choice, for many applications, in that they are smaller, simpler in design and cost less to operate than other technologies like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic absorption (AA) or atomic fluorescence (AF) spectroscopy. Examples of some common EDXRF applications are: Cement and raw meal: sulfur, iron, calcium, silicon, aluminum, magnesium, etc; Kaolin clay: titanium, iron, aluminum, silicon, etc; Granular catalysts: palladium, platinum, rhodium, ruthenium, etc; Ores: copper, tin, gold, silver, etc; Cement and mortar fillers: sulfur in ash; Gasoline, diesel and RFG: sulfur, manganese, lead, etc; Residual gas oils: sulfur, chlorine, vanadium, nickel, etc; Secondary oil: chlorine, etc; Kerosine, naphtha: sulfur, etc; Crude oil and bunker fuels: sulfur, vanadium, nickel, etc; Plating, pickling & pre-treatment baths: gold, copper, rhodium, platinum, nickel, sulfates, phosphates, chlorides, etc; Acetic acid: magnesium, cobalt and bromine; Terephthalic acid (TPA): cobalt, manganese, iron, etc; Dimethyl terephthalate (DMT): heavy metals; PVC copolymer solutions: chlorine; Photographic emulsion: silver; Clay: metals and non-metals; Waste and effluent streams: RCRA metals, chlorides, phosphates, etc; Food, pet food and other animal feed: potassium, phosphorus and chlorine; Cosmetics: zinc, titanium, calcium, manganese, iron, silicon, phosphorus, sulfur, aluminum, and sodium; Wood treatment: CCA, Penta, ACQ, ACZA, phosphorus-based fire retardants, copper naphthanate, zinc napthanate, TBTO, IPBC and combinations of these; Antacids: calcium; and Toothpaste: phosphorus and tin.

Standardless (FP) Elemental Analysis with EDXRF

Rigaku X-ray spectrometers may be used in conjunction with Fundamental Parameters (FP) software to allow for elemental quantification of completely unknown samples without standards. For example, the Rigaku NEX CG energy dispersive X-ray fluorescence analyzer is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative elemental analysis of almost all sample types without standards – and rigorous quantitative analysis with standards.

Featuring Rigaku’s famous Scatter FP method, the software can automatically estimate the elemental concentration of unobserved low atomic number elements (H to F) and provide appropriate corrections. RPF-SQX greatly reduces the number of required standards, for a given level of calibration fit, as compared to conventional EDXRF spectrometric analytical software. As elemental analysis standards are expensive, and can be difficult to obtain for many applications, the utility of RPF-SQX can significantly lower the cost of ownership and reduce workload requirements for routine energy dispersive X-ray fluorescence based elemental analysis.

Cartesian geometry with polarization for highest peak-to-background

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of conventional direct excitation, sensitivity is further improved.

The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, results in a spectrometer capable of routine trace element analysis even in difficult sample types. Up to five polarization and secondary targets cover the complete elemental range (Na-U) with optimized sensitivity.

As illustrated in the spectral plot (left), cartesian geometry with secondary targets and polarization delivers exceptional signal-to-noise (orange spectrum) as compared to a conventional direct excitation EDXRF system (blue spectrum).

Aqueous Liquid Sample Carrier for PPB-level Trace Element Analysis

With the patented Rigaku UltraCarry, you can use your Rigaku NEX CG spectrometer to quantify trace elements in aqueous liquids down to parts-per-billion (ppb) concentration levels. Routine elemental analysis of contaminated water or industrial wastewater can now be performed without an Atomic Absorption (AA) or Inductively Coupled Plasma (ICP) spectrometer. UltraCarry based trace element analysis is suitable for use by non-technical personnel.

- Analyze a wide range of elements (11Na to 92U)

- ppb level elemental detection limits for aqueous samples

- Simple three-step process: pipette, dry and measure

- Easy-to-use EZ Analysis NEX CG user interface

EDXRF trace element analysis only from Rigaku

UltraCarry is a novel disposable (single-use) sample retainer for X-ray fluorescence (XRF) analysis that is used to preconcentrate a liquid sample into an uniform sample carrier that is optimized for the suppression of background noise. This approach dramatically improves the signal-to-noise ratio, resulting in almost three orders of magnitude improvement in the Lower Limit of Detection (LLD or LOD) and Limit of Quantification (LOQ) for heavy elements.

The UltraCarry sample retainer comprises a ring-shaped support fitted with a X-ray transmissive hydrophobic film and central liquid absorbent element pad. For routine analysis using UltraCarry, a recommended vacuum dryer apparatus — Rigaku UltraDry — is available as an XRF accessory.